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For methodology Found Datasheets File :: 1655    Search Time::1.109ms    
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    AFT18H357-24N AFT18H357-24NR6

NXP Semiconductors
Part No. AFT18H357-24N AFT18H357-24NR6
OCR Text ...protection characteristics test methodology class human body model (per jesd22--a114) 2 machine model (per eia/jesd22--a115) b charge device model (per jesd22--c101) iv table 4. moisture sensitivity level test methodology rating package pea...
Description N-Channel Enhancement-Mode Lateral MOSFET

File Size 517.87K  /  17 Page

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    Freescale Semiconductors
Part No. MRF6S21100NBR1 MRF6S21100N
OCR Text ... to AN1955, Thermal Measurement methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reason...
Description  Designed for W-CDMA base station applications with frequencies from 2110 to 2170 MHz

File Size 510.14K  /  12 Page

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    MD8IC970NR1

Freescale Semiconductor, Inc
Part No. MD8IC970NR1
OCR Text ...rotection Characteristics Test methodology Human Body Model (per JESD22--A114) Machine Model (per EIA/JESD22--A115) Charge Device Model (per JESD22--C101) Class 1A (Minimum) A (Minimum) I (Minimum) Table 4. Moisture Sensitivity Level T...
Description RF LDMOS Wideband Integrated Power Amplifier

File Size 399.75K  /  14 Page

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    MRFG35003N6AT1

Freescale Semiconductor, Inc
Part No. MRFG35003N6AT1
OCR Text ...rotection Characteristics Test methodology Human Body Model (per JESD22 - A114) Machine Model (per EIA/JESD22 - A115) Charge Device Model (per JESD22 - C101) Class 2 (Minimum) A (Minimum) IV (Minimum) Table 4. Moisture Sensitivity Level...
Description Gallium Arsenide PHEMT RF Power Field Effect Transistor

File Size 213.06K  /  11 Page

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    MW7IC2725GNR1 MW7IC2725NBR1 MW7IC2725NR1

Freescale Semiconductor, Inc
Part No. MW7IC2725GNR1 MW7IC2725NBR1 MW7IC2725NR1
OCR Text ...rotection Characteristics Test methodology Human Body Model (per JESD22 - A114) Machine Model (per EIA/JESD22 - A115) Charge Device Model (per JESD22 - C101) Class 1B (Minimum) A (Minimum) II (Minimum) Table 4. Moisture Sensitivity Leve...
Description RF LDMOS Wideband Integrated Power Amplifiers

File Size 809.04K  /  24 Page

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    MW7IC2750GNR1 MW7IC2750NBR1 MW7IC2750NR1

Freescale Semiconductor, Inc
Part No. MW7IC2750GNR1 MW7IC2750NBR1 MW7IC2750NR1
OCR Text ...rotection Characteristics Test methodology Human Body Model (per JESD22 - A114) Machine Model (per EIA/JESD22 - A115) Charge Device Model (per JESD22 - C101) Class 1C (Minimum) A (Minimum) III (Minimum) Table 4. Moisture Sensitivity Lev...
Description RF LDMOS Wideband Integrated Power Amplifiers

File Size 875.75K  /  25 Page

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    MRF8P9040GNR1 MRF8P9040NBR1 MRF8P9040NR1

NXP Semiconductors
Part No. MRF8P9040GNR1 MRF8P9040NBR1 MRF8P9040NR1
OCR Text ...protection characteristics test methodology class human body model (per jesd22--a114) 1b (minimum) machine model (per eia/jesd22--a115) a (minimum) charge device model (per jesd22--c101) iii (minimum) table 4. moisture sensitivity level tes...
Description N-Channel Enhancement-Mode Lateral MOSFET

File Size 903.14K  /  23 Page

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    MW7IC2750NR110 MW7IC2750GNR1 MW7IC2750NBR1

Freescale Semiconductor, Inc
http://
Part No. MW7IC2750NR110 MW7IC2750GNR1 MW7IC2750NBR1
OCR Text ...rotection Characteristics Test methodology Human Body Model (per JESD22-A114) Machine Model (per EIA/JESD22-A115) Charge Device Model (per JESD22-C101) Class 1C (Minimum) A (Minimum) III (Minimum) Table 4. Moisture Sensitivity Level Te...
Description RF LDMOS Wideband Integrated Power Amplifiers

File Size 893.11K  /  25 Page

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    MRF6VP11KHR609

Freescale Semiconductor, Inc
Freescale Semiconductor...
Part No. MRF6VP11KHR609
OCR Text ... to AN1955, Thermal Measurement methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. (c) Freescale Semiconductor, Inc., 2008-2009. All rights reserved. MRF6VP11KHR6 1 ...
Description RF Power Field Effect Transistor N-Channel Enhancement-Mode Lateral MOSFET

File Size 460.92K  /  11 Page

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    AFT09S282N AFT09S282NR3

NXP Semiconductors
Part No. AFT09S282N AFT09S282NR3
OCR Text ...protection characteristics test methodology class human body model (per jesd22--a114) 2 machine model (per eia/jesd22--a115) b charge device model (per jesd22--c101) iv table 4. moisture sensitivity level test methodology rating package pea...
Description N-Channel Enhancement-Mode Lateral MOSFET

File Size 522.54K  /  14 Page

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For methodology Found Datasheets File :: 1655    Search Time::1.109ms    
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