| |
|
 |
Fairchild Semiconductor Corporation
|
| Part No. |
SCANPSC110FSC
|
| OCR Text |
...it tck counter enables built in self test oper- ations to be performed on one port while other scan chains are simultaneously tested. featur...scanned at higher frequencies without violating set-up and hold times. lsb least significant bit, th... |
| Description |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
|
| File Size |
276.96K /
25 Page |
 View
it Online |
Download Datasheet
|
| |
|
|
SAMSUNG SEMICONDUCTOR CO. LTD.
|
| Part No. |
KS32C6100
|
| OCR Text |
...nd cas before ras refresh, dram self-refresh, fast page and edo dram access modes support ? progra mmable memory bank size and location definition to provide a flexible memory map. ? progra mmable memory access times ( 2 to 7 wait ing cycl... |
| Description |
16/32-Bit RISC Microcontroller(16/32-RISC微控制器)
|
| File Size |
31.41K /
5 Page |
View
it Online |
Download Datasheet |
|
For
self-scanned Found Datasheets File :: 80 Search Time::1.031ms
Page :: | 1 | 2 | 3 | 4 | <5> | 6 | 7 | 8 | 9 | |
▲Up To
Search▲ |
|
Price and Availability
|
