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DISCRETE SEMICONDUCTORS
DATA SHEET
dbook, halfpage
M3D050
BAS45A Low-leakage diode
Product data sheet Supersedes data of June 1994 1996 Mar 13
NXP Semiconductors
Product data sheet
Low-leakage diode
FEATURES * Continuous reverse voltage: max. 125 V * Repetitive peak forward current: max. 625 mA * Low reverse current: max. 1 nA * Switching time: typ. 1.5 s.
k handbook, halfpage a
BAS45A
DESCRIPTION Epitaxial medium-speed switching diode with a low leakage current in a hermetically-sealed glass SOD68 (DO-34) package.
MAM156
APPLICATION * Low leakage current applications.
Fig.1 Simplified outline (SOD68; DO-34) and symbol.
LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 134). SYMBOL VRRM VR IF IFRM IFSM PARAMETER repetitive peak reverse voltage continuous reverse voltage continuous forward current repetitive peak forward current non-repetitive peak forward current square wave; Tj = 25 C prior to surge; see Fig.4 tp = 1 s tp = 1 ms tp = 1 s Ptot Tstg Tj Note 1. Device mounted on a printed-circuit board without metallization pad. total power dissipation storage temperature junction temperature Tamb = 25 C - - - - -65 - 4 1 0.5 300 +175 175 A A A mW C C see Fig.2; note 1 CONDITIONS MIN. - - - - MAX. 125 125 250 625 V V mA mA UNIT
1996 Mar 13
2
NXP Semiconductors
Product data sheet
Low-leakage diode
ELECTRICAL CHARACTERISTICS Tj = 25 C unless otherwise specified. SYMBOL VF PARAMETER forward voltage see Fig.3 IF = 1 mA IF = 10 mA IF = 100 mA IR reverse current see Fig.5 VR = 125 V; Emax = 100 lx VR = 30 V; Tj = 125 C; Emax = 100 lx VR = 125 V; Tj = 125 C; Emax = 100 lx VR = 125 V; Tj = 150 C; Emax = 100 lx Cd trr diode capacitance reverse recovery time f = 1 MHz; VR = 0; see Fig.6 when switched from IF = 10 mA to IR = 10 mA; RL = 100 ; measured at IR = 1 mA; see Fig.7 - - - - - 1.5 - - - CONDITIONS TYP.
BAS45A
MAX. 780 860 1 000 1 300 500 2 4 -
UNIT mV mV mV nA nA nA A pF s
THERMAL CHARACTERISTICS SYMBOL Rth j-tp Rth j-a Note 1. Device mounted on a printed-circuit board without metallization pad. PARAMETER thermal resistance from junction to tie-point thermal resistance from junction to ambient CONDITIONS 8 mm from the body lead length 10 mm; note 1 VALUE 300 500 UNIT K/W K/W
1996 Mar 13
3
NXP Semiconductors
Product data sheet
Low-leakage diode
GRAPHICAL DATA
BAS45A
handbook, halfpage
300
MBG522
handbook, halfpage
300
MBG523
IF (mA) 200
IF (mA)
(1) (2) (3)
200
100
100
0 0 100
Tamb (oC)
0 200 0 0.5 1.0 VF (V) 1.5
Device mounted on a printed-circuit board without metallization pad.
(1) Tj = 150 C; typical values. (2) Tj = 25 C; typical values. (3) Tj = 25 C; maximum values.
Fig.2
Maximum permissible continuous forward current as a function of ambient temperature.
Fig.3
Forward current as a function of forward voltage.
102 handbook, full pagewidth IFSM (A)
MBG704
10
1
10-1 1 10
102
103
tp (s)
104
Based on square wave currents;Tj = 25 C prior to surge.
Fig.4
Maximum permissible non-repetitive peak forward current as a function of pulse duration.
1996 Mar 13
4
NXP Semiconductors
Product data sheet
Low-leakage diode
BAS45A
10 4 handbook, halfpage IR (nA) 3 10
MBD456
handbook, halfpage
3
MBG524
Cd (pF)
10 2
max
2
10
typ
1
1
10 1
0
50
100
T j ( oC)
150
0 0 5 10 15 VR (V) 20
VR = 125 V.
f = 1 MHz; Tj = 25 C.
Fig.5
Reverse current as a function of junction temperature.
Fig.6
Diode capacitance as a function of reverse voltage; typical values.
handbook, full pagewidth
tr
tp t
D.U.T.
RS = 50 V = VR IF x R S
10% SAMPLING OSCILLOSCOPE IF t rr t
IF
R i = 50
VR 90% (1)
MGA881
input signal
output signal
Fig.7 Reverse recovery time test circuit and waveforms.
1996 Mar 13
5
NXP Semiconductors
Product data sheet
Low-leakage diode
PACKAGE OUTLINE
BAS45A
handbook, full pagewidth
0.55 max 1.6 max 25.4 min 3.04 max 25.4 min
MSA212 - 1
Dimensions in mm. The black marking band indicates the cathode.
Fig.8 SOD68 (DO-34).
1996 Mar 13
6
NXP Semiconductors
Product data sheet
Low-leakage diode
DATA SHEET STATUS DOCUMENT STATUS(1) Objective data sheet Preliminary data sheet Product data sheet Notes 1. Please consult the most recently issued document before initiating or completing a design. PRODUCT STATUS(2) Development Qualification Production DEFINITION
BAS45A
This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification.
2. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. DISCLAIMERS General Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. Quick reference data The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding.
1996 Mar 13
7
NXP Semiconductors
Customer notification This data sheet was changed to reflect the new company name NXP Semiconductors. No changes were made to the content, except for the legal definitions and disclaimers.
Contact information For additional information please visit: http://www.nxp.com For sales offices addresses send e-mail to: salesaddresses@nxp.com
(c) NXP B.V. 2009 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Printed in The Netherlands 1996 Mar 13

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