doc. no : qw0905- rev. : date : data sheet ligitek electronics co.,ltd. property of ligitek only rectangle type led lamps - 2008 14 - mar. LH85740-PF-08 b LH85740-PF lead-free parts pb
note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation package dimensions ligitek electronics co.,ltd. property of ligitek only 25.0min + - 1.0min 0.5 0.05 0.7max 0.5max 0.25max part no. LH85740-PF 7.0 0.1 1.75 0.1 1.65 0.1 3.8 0.1 3.9 0.1 page 1/5 2.54typ -60 75% 100%50% -30 60 0 25%25%50%100% 75% 30 0
page ligitek electronics co.,ltd. property of ligitek only typical electrical & optical characteristics (ta=25 ) absolute maximum ratings at ta=25 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. viewing angle 2 1/2 (deg) min. min. forward voltage @ ma(v) typ. lens peak wave length pnm spectral halfwidth nm luminous intensity @10ma(mcd) typ. emitted part no material color unit ma ma a mw 15 40 red ratings 10 ir -40 ~ +85 -40 ~ +100 40 forward current peak forward current duty 1/10@10khz parameter operating temperature storage temperature reverse current @5v power dissipation symbol t opr tstg i f pd i fp red diffused 697 90 1.7 2.1 0.8 1.8 48 LH85740-PF red gap 10 2/5 part no. LH85740-PF
r e l a t i v e i n t e n s i t y @ 2 0 m a 600 0.0 0.5 wavelength (nm) 700800900 ambient temperature( ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 1.0 -20 -40 0.8 1.0 0.9 1.1 1.2 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 -20 ambient temperature( ) 80 60 40 20 0-40 100 0.0 80 60 02040100 fig.4 relative intensity vs. temperature 2.5 1.5 1.0 2.0 3.0 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 100 f o r w a r d c u r r e n t ( m a ) 0.1 1.0 1.0 10 1000 h chip r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a forward voltage(v) 2.03.04.05.01.0 0.0 1.5 1.0 0.5 2.0 2.5 forward current(ma) 101001000 fig.2 relative intensity vs. forward current 3.0 ligitek electronics co.,ltd. property of ligitek only 1000 3/5 page part no. LH85740-PF
5 /sec max note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 25 0 0 120 2 /sec max preheat 50 100 dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) 260 temp( c) 260 c3sec max 2.wave soldering profile 150 time(sec) ligitek electronics co.,ltd. property of ligitek only soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) page 4/5 60 seconds max part no. LH85740-PF
the purpose of this test is the resistance of the device under tropical for hours. solderability test solder resistance test 1.t.sol=230 5 2.dwell time=5 1sec this test intended to see soldering well performed or not. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=260 5 2.dwell time= 10 1sec. high temperature high humidity test thermal shock test low temperature storage test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 jis c 7021: b-12 ligitek electronics co.,ltd. property of ligitek only reliability test: high temperature storage test operating life test test item this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-883:1008 jis c 7021: b-10 reference standard page5/5 part no. LH85740-PF
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