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  1SS397 2001-06-07 1 toshiba diode silicon epitaxial planar diode 1SS397 high voltage, high speed switching applications  low forward voltage : v f = 1.0v (typ.)  high voltage : v r = 400v (min.)  fast reverse recovery time : t rr = 0.5s (typ.)  small total capacitance : c t = 2.5pf (typ.)  small package : sc-70 maximum ratings (ta = 25c) characteristic symbol rating unit maximum (peak) reverse voltage v rm 420 v reverse voltage v r 400 v maximum (peak) forward current i fm 300 ma average forward current i o 100 ma surge current (10ms) i fsm 2 a power dissipation p 100 mw junction temperature t j 125 c storage temperature range t stg ? 55  125 c electrical characteristics (ta = 25c) characteristic symbol test circuit test condition min typ. max unit v f (1) D i f = 10ma D 0.8 D forward voltage v f (2) D i f = 100ma D 1.0 1.3 v i r (1) D v r = 300v D D 0.1 reverse current i r (2) D v r = 400v D D 1.0 a total capacitance c t D v r = 0, f = 1mh z D 2.5 5.0 pf reverse recovery time t rr D i f = 10ma (fig.1) D 0.5 D s jedec D eiaj sc-70 toshiba 1-2p1d weight: 0.006g unit: mm
1SS397 2001-06-07 2 equivalent circuit fig.1 reverse recovery time (t rr ) test circuit (top view) marking
1SS397 2001-06-07 3
1SS397 2001-06-07 4  toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc..  the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk.  the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others.  the information contained herein is subject to change without notice. 000707ea a restrictions on product use


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